Jeff Gust

Jeff Gust is the Chief Corporate Metrologist for Fluke Corporation. He is a recognized member of the international metrology community, holding active roles with several leading professional organizations. Jeff has authored numerous technical papers on various metrology topics, is a recognized authority in proficiency testing and has performed more than 50 laboratory accreditation assessments. He holds a B.S. in Physics from Purdue University, is a past President of NCSLI and a recipient of the Measurement Science Conference Woodington award.

Follow Jeff at:

LinkedIn